Isolating and Characterizing Critical Traces Using EM Analysis
Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to perform EM analysis to isolate/characterize critical traces within complex multi-layer configurations of today’s modern applications.
This application note examines how the combined Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to perform EM analysis to isolate and characterize critical traces within the complex multi-layer configurations of today’s modern applications.