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Isolating and Characterizing Critical Traces Using EM Analysis

March 24, 2021

Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to perform EM analysis to isolate/characterize critical traces within complex multi-layer configurations of today’s modern applications.

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This application note examines how the combined Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to perform EM analysis to isolate and characterize critical traces within the complex multi-layer configurations of today’s modern applications.