APPLICATION NOTE
Isolating and Characterizing Critical Traces
Using EM Analysis
The Cadence
®
AWR
®
AXIEM
®
electromagnetic (EM) simulator is integrated with the Cadence
Virtuoso
®
RF Solution, providing designers with an integrated circuit (IC) and package/module
design flow that improves productivity by eliminating the design failures caused by the
manual translation of data. A single golden schematic is used for simulation, layout versus
schematic (LVS), and EM analysis and verification, without the need for unique schematics for
EM and LVS.
Design Overview
This application note examines how the combined Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to
perform EM analysis to isolate and characterize critical traces within the complex multi-layer configurations of today's
modern applications.