AWR Application Notes

Isolating and Characterizing Critical Traces Using EM Analysis

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APPLICATION NOTE Isolating and Characterizing Critical Traces Using EM Analysis The Cadence ® AWR ® AXIEM ® electromagnetic (EM) simulator is integrated with the Cadence Virtuoso ® RF Solution, providing designers with an integrated circuit (IC) and package/module design flow that improves productivity by eliminating the design failures caused by the manual translation of data. A single golden schematic is used for simulation, layout versus schematic (LVS), and EM analysis and verification, without the need for unique schematics for EM and LVS. Design Overview This application note examines how the combined Virtuoso RF Solution/AWR AXIEM EM simulator enables designers to perform EM analysis to isolate and characterize critical traces within the complex multi-layer configurations of today's modern applications.

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